Keynote Presentation
The Convergence of EMC and Signal/Power Integrity Engineering
Presented by: Christian Schuster, Ph.D., IEEE Fellow
Tuesday, August 19th
Time: 8:30 – 9:30 AM
Location: Ballroom C
EMC engineering – the control of unwanted electromagnetic emissions and interference – and signal/power integrity (SIPI) engineering – the design of interconnects and packages that provide adequate signal transmission and power supply of electronic systems – seem to have a lot in common … or not, depending on how you look at it!

EMC engineering – seen from an exclusive SIPI perspective – is dealing with mostly regulatory compliance related, “low-frequency” problems such as ground loops and radiation from cables. Modeling and simulation are often difficult, test and measurement are paramount. In the end, “copper tape and ferrites” solve all problems.
SIPI engineering – seen from an exclusive EMC perspective – is dealing with mostly system performance related, “well-known” problems such as transmission line crosstalk and galvanic coupling. Modeling and simulation are paramount, test and measurement are often difficult. In the end, “equalization and integration” solve all problems.
Now, obviously, that’s not how it really is!
Drawing from personal experience and the experience of other professionals well known in industry and academia, I will try to show that EMC and SIPI engineering are two sides of the same problem (control of currents, if you will) and that both sides can benefit from each other by being aware of the concepts, methods, and solutions that exist in their respective domains. I will also try to make the point that due to ever increasing data rates and power levels of digital systems EMC and SIPI engineering are on a path of “convergence” – if we want it or not.

Christian Schuster, Hamburg University of Technology, Germany (IEEE Fellow)
Christian Schuster received a Diploma degree in physics in 1996 and a Ph. D. degree in electrical engineering in 2000. Since 2006 he is a full professor at Hamburg University of Technology (TUHH), Germany. Prior to TUHH he was with the IBM T. J. Watson Research Center, Yorktown Heights, NY. His interests include signal and power integrity of digital systems, multiport measurement and calibration techniques, and development of physics-based as well as data-based modeling, simulation and optimization methods for EMC+SIPI. In the recent past, he has served as an Associate Editor for the IEEE Transactions on EMC as well as an Adjunct Associate Professor at the School of Electrical and Computer Engineering of the Georgia Institute of Technology. Currently, he is serving as President of the NIT Northern School of Technology Management at TUHH.